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Information Name: | Nanjing Fairchild Fairchild technology _ _ Yaokun Technology (Certified Merchant) |
Published: | 2015-01-03 |
Validity: | 0 |
Specifications: | Limited |
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Detailed Product Description: | Integrated circuit (IC) electrostatic discharge (ESD) ruggedness can be distinguished by a variety of tests. The most common type of test is the human body model (HBM) and the charging device model (CDM). These two types of tests designed to reveal contain ESD Basic ESD controlled manufacturing environment, the circuit subsisting under what circumstances ESD stress. HBM ESD is the oldest application testing, but the factory ESD control experts generally believe that in the modern highly automated assembly operations, CDM ESD testing is more important. CDM stress magnitude will vary with the size of the device. About the CDM's "conventional wisdom" is more the size of a very small saw no need to test integrated circuits, because the peak current is fast. 1. The diode reverse breakdown Zener breakdown mechanism into reverse breakdown by zener and avalanche breakdown in both cases. In the case of high impurity concentration, due to the barrier width is small Fairchild distribution, reverse voltage larger Fairchild drive prices, undermining the potential barrier region covalent bond structure, so that the valence electron from the covalent key constraint to produce electron - hole pairs, resulting in a sharp increase in current, which is called zener breakdown. If the doping concentration is low, the barrier width is wider, not prone to zener. 2. Another avalanche breakdown of avalanche breakdown. When the reverse voltage is increased to a larger value Fairchild, the applied electric field to accelerate the electron drift velocity, thereby covalent bond valence electrons collide, the valence electrons knocked covalent bond, generating new electron - hole right. The new generation of electron - hole is then dislodge other valence electric field accelerates electrons, an avalanche of carriers increases, resulting in a sharp increase in current, which is called avalanche breakdown. Either breakdown, if its current unchecked, may result in permanent damage to the PN junction. MRA4007T3G Nanjing Fairchild Fairchild technology _ _ 耀坤 Technology (certified merchants) provided by Nanjing 耀坤 Technology Limited. Nanjing Yaokun Ltd. (www.njykkj.com) is specialized in the "IC, FET, relays, power supply module" of the enterprise, the company of "honesty, hard service" concept, to provide you with the most quality products and services. Welcome to inquire! Contact: Yang Kun. |
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Copyright © GuangDong ICP No. 10089450, Nanjing Yaokun Ltd. All rights reserved.
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You are the 12453 visitor
Copyright © GuangDong ICP No. 10089450, Nanjing Yaokun Ltd. All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility